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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 11 — May. 25, 2009
  • pp: 8998–9005

Simple method to determine dispersion of high-finesse optical cavities

T.J. Hammond, Arthur K. Mills, and David J. Jones  »View Author Affiliations


Optics Express, Vol. 17, Issue 11, pp. 8998-9005 (2009)
http://dx.doi.org/10.1364/OE.17.008998


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Abstract

We present a simple and quick, yet accurate method to measure the dispersion of high finesse optical cavities. By exciting the cavity with a femtosecond frequency comb and measuring the resonance condition as a function of optical frequency, the cavity’s dispersion can be determined with minimal uncertainty. Measurement results are presented from an evacuated reference cavity with low group delay dispersion as well as several differential, intra-cavity measurements of well known optical materials demonstrating the dynamic range and accuracy of this technique.

© 2009 Optical Society of America

OCIS Codes
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(140.4050) Lasers and laser optics : Mode-locked lasers
(320.7160) Ultrafast optics : Ultrafast technology

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: March 10, 2009
Revised Manuscript: May 4, 2009
Manuscript Accepted: May 13, 2009
Published: May 14, 2009

Citation
T. J. Hammond, Arthur K. Mills, and David J. Jones, "Simple method to determine dispersion of high-finesse optical cavities," Opt. Express 17, 8998-9005 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-11-8998


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References

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