OSA's Digital Library

Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 11 — May. 25, 2009
  • pp: 9157–9170

Low coherence interferometry for central thickness measurement of rigid and soft contact lenses

I. Verrier, C. Veillas, and T. Lépine  »View Author Affiliations

Optics Express, Vol. 17, Issue 11, pp. 9157-9170 (2009)

View Full Text Article

Enhanced HTML    Acrobat PDF (1220 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



In this paper we propose contact lens central thickness measurement with a low coherence interferometry technique using either a SLED source or a broadband continuum generated in air-silica Microstructured Optical Fiber (MOF) pumped with a picosecond microchip laser. Each of these sources associated with the interferometer provides, at the same time, good measurement resolution and quick signal recording without moving any optical elements and without need of a Fourier Transform operation. Signal improvement is performed afterwards by a numerical treatment for optimal correlation peaks detection leading to central thickness value of several contact lenses.

© 2009 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: February 11, 2009
Revised Manuscript: March 19, 2009
Manuscript Accepted: March 20, 2009
Published: May 15, 2009

I. Verrier, C. Veillas, and T. Lépine, "Low coherence interferometry for central thickness measurement of rigid and soft contact lenses," Opt. Express 17, 9157-9170 (2009)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. M. A. Marcus, J. R. Lee, H. W. Harris, and R. Kelbe, "Apparatus for measuring Material Thickness Profiles," US Patent # 6067161 (2000).
  2. M. A. Marcus, J. R. Lee, and H. W. Harris, "Method for measuring material thickness profiles," US Patent # 6038027 (2000).
  3. T. Blalock and S. Heveron-Smith, "Practical applications in film and optics measurements for dual light source interferometry," Proc. SPIE 5589, 107-113 (2004). [CrossRef]
  4. B. E. Bouma and G. J. Tearney, Handbook of optical coherence tomography (New York: Marcel Dekker 2002).
  5. Q1. J. M. Schmitt, "Optical Coherence Tomography (OCT): A review," IEEE J. of Sel. Top. Quantum Electron. 5, 1205-1215 (1999). [CrossRef]
  6. A. F. Fercher, W. Drexler, C. K. Hitzenberger, and T. Lasser, "Optical coherence tomography principles and applications," Rep. Prog. Phys. 66, 239-303 (2003). [CrossRef]
  7. R. Leitbeg, C. K. Hitzenberger, and A. F. Fercher, "Performance of Fourier domain vs. time domain optical coherence tomography," Opt. Express 11, 889-894 (2003). [CrossRef]
  8. R. Leitbeg, M. Wojtkowski, A. Kowalczyk, C. K. Hitzenberger, M. Sticker, and A. F. Fercher, "Spectral measurement of absorption by spectroscopic frequency-domain optical coherence tomography," Opt. Lett. 25, 820-822 (2000). [CrossRef]
  9. Y. Park, T. J. Ahn, J. C. Kieffer, and J. Azana, "Optical Frequency domain reflectometry based on real-time Fourier Transformation," Opt. Express 15, 4597-4616 (2007). [CrossRef] [PubMed]
  10. C. Dorrer, N. Belabas, J. P. Likforman, and M. Joffre, "Spectral resolution and sampling issues in Fourier-Transform spectral interferometry," J. Opt. Soc. Am. B 17, 1795-1802 (2000). [CrossRef]
  11. C. Dorrer, "Influence of the calibration of the detector on spectral interferometry," J. Opt. Soc. Am. B 16, 1160-1168 (1999). [CrossRef]
  12. K. Ben Houcine, G. Brun, M. Jacquot, I. Verrier, D. Reolon, and C. Veillas, "Temporal analysis of optical complex structures: application to tomography through scattering media," Proc. SPIE 5249, 526-533 (2004). [CrossRef]
  13. K. Ben Houcine, M. Jacquot, I. Verrier, G. Brun, and C. Veillas, "Imaging through scattering medium using SISAM correlator," Opt. Lett. 29, 2908-2910 (2004).
  14. V. Tombelaine, C. Lesvigne, P. Leproux, L. Grossard, V. Couderc, J. L. Auguste, J. M. Blondy, G. Huss, and P. H. Pioger, "Ultra wide band supercontinuum generation in air-silica holey fibers by SHG-induced modulation instabilities," Opt. Express 13,7399-7404 (2005). [CrossRef] [PubMed]
  15. I. Verrier, G. Brun, and J. P. Goure, "SISAM interferometer for distance measurement," Appl. Opt. 36, 6 (1997). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited