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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 11 — May. 25, 2009
  • pp: 9157–9170

Low coherence interferometry for central thickness measurement of rigid and soft contact lenses

I. Verrier, C. Veillas, and T. Lépine  »View Author Affiliations


Optics Express, Vol. 17, Issue 11, pp. 9157-9170 (2009)
http://dx.doi.org/10.1364/OE.17.009157


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Abstract

In this paper we propose contact lens central thickness measurement with a low coherence interferometry technique using either a SLED source or a broadband continuum generated in air-silica Microstructured Optical Fiber (MOF) pumped with a picosecond microchip laser. Each of these sources associated with the interferometer provides, at the same time, good measurement resolution and quick signal recording without moving any optical elements and without need of a Fourier Transform operation. Signal improvement is performed afterwards by a numerical treatment for optimal correlation peaks detection leading to central thickness value of several contact lenses.

© 2009 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: February 11, 2009
Revised Manuscript: March 19, 2009
Manuscript Accepted: March 20, 2009
Published: May 15, 2009

Citation
I. Verrier, C. Veillas, and T. Lépine, "Low coherence interferometry for central thickness measurement of rigid and soft contact lenses," Opt. Express 17, 9157-9170 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-11-9157


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References

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