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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 12 — Jun. 8, 2009
  • pp: 10076–10081

High repetition rate UV ultrafast laser inscription of buried channel waveguides in Sapphire: Fabrication and fluorescence imaging via ruby R lines

Antonio Benayas, Daniel Jaque, Ben McMillen, and Kevin P. Chen  »View Author Affiliations

Optics Express, Vol. 17, Issue 12, pp. 10076-10081 (2009)

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We report on the fabrication of buried cannel waveguides in Sapphire crystals by 250-kHz high repetition rate ultrafast laser inscription with 385 nm pulses. The propagation properties of the waveguides were studied as a function of the writing conditions. The micro-fluorescence analysis of the R lines generated by trace Cr3+ dopant in Sapphire is used to elucidate the micro-structural modifications induced in the crystal network. It is revealed that waveguide has been formed due to local dilatation of the Sapphire network generated in the surroundings of the focal volume. The refractive index increment due to the dilatation induced electronic polarizability enhancement has been estimated to be of the order of Δn ≈10−4.

© 2009 OSA

OCIS Codes
(180.2520) Microscopy : Fluorescence microscopy
(230.7370) Optical devices : Waveguides

ToC Category:
Laser Microfabrication

Original Manuscript: April 10, 2009
Revised Manuscript: May 22, 2009
Manuscript Accepted: May 24, 2009
Published: June 1, 2009

Antonio Benayas, Daniel Jaque, Ben McMillen, and Kevin P. Chen, "High repetition rate UV ultrafast laser inscription of buried channel waveguides in Sapphire: Fabrication and fluorescence imaging via ruby R lines," Opt. Express 17, 10076-10081 (2009)

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