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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 12 — Jun. 8, 2009
  • pp: 10155–10167

Plasmon polaritons in the near infrared on fluorine doped tin oxide films

Lorenzo Dominici, Francesco Michelotti, Thomas M. Brown, Andrea Reale, and Aldo Di Carlo  »View Author Affiliations


Optics Express, Vol. 17, Issue 12, pp. 10155-10167 (2009)
http://dx.doi.org/10.1364/OE.17.010155


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Abstract

Here we investigate plasmon polaritons in fluorine doped tin oxide (FTO) films. By fitting reflectance and transmittance measurements as a function of wavelength λ ∊ [1.0µm,2.5µm] we derive a Drude dispersion relation of the free electrons in the transparent conducting oxide films. Then we compute the dispersion curves for the bulk and surface modes together with a reflectance map over an extended wavelength region (λ ⇑ 10µm). Although the surface polariton dispersion for a single FTO/air interface when neglecting damping should appear clearly in the plots in the considered region (since it is supposedly far and isolated from other resonances), a complex behaviour can arise. This is due to different characteristic parameters, such as the presence of a finite extinction coefficient, causing an enlargement and backbending of the feature, and the low film thickness, via coupling between the modes from both the glass/FTO and FTO/air interfaces. Taking into account these effects, computations reveal a general behaviour for thin and absorbing conducting films. They predict a thickness dependent transition region between the bulk polariton and the surface plasmon branches as previously reported for indium tin oxide. Finally, attenuated total reflection measurements vs the incidence angle are performed over single wavelengths lines R(θ) (λ=0.633,0.830,1.300,1.550µm) and over a two dimensional domain R(θ,λ) in the near infrared region λ ∊ [1.45µm,1.59µm]. Both of these functions exhibit a feature which is attributed to a bulk polariton and not to a surface plasmon polariton on the basis of comparison with spectrophotometer measurements and modeling. The predicted range for the emergence of a surface plasmon polariton is found to be above λ≥2.1µm, while the optimal film thickness for its observation is estimated to be around 200nm.

© 2009 Optical Society of America

OCIS Codes
(240.6680) Optics at surfaces : Surface plasmons
(310.7005) Thin films : Transparent conductive coatings

ToC Category:
Optics at Surfaces

History
Original Manuscript: March 17, 2009
Revised Manuscript: April 23, 2009
Manuscript Accepted: April 23, 2009
Published: June 2, 2009

Citation
Lorenzo Dominici, Francesco Michelotti, Thomas M. Brown, Andrea Reale, and Aldo Di Carlo, "Plasmon polaritons in the near infrared on fluorine doped tin oxide films," Opt. Express 17, 10155-10167 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-12-10155


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  35. We put a note here about the physical quantities used. In general, it is possible to represent the map in terms of θamp; or k on one axis (or also n0sin θ), and in terms of λ or ω on the other. Experimental maps often are (θ -λ) or (θ-ω), while theoretical ones can be (k-ω) when representing the light dispersion curves. When passing from this last kind of visualization to another, an SPP typical dispersion would be somehow differently displayed.

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