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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 12 — Jun. 8, 2009
  • pp: 9828–9833

A novel method for measuring continuous dispersion spectrum of electro-optic coefficients of nonlinear materials

Seoung Hun Lee, Seung Hwan Kim, Kyong Hon Kim, Min Hee Lee, and El-Hang Lee  »View Author Affiliations


Optics Express, Vol. 17, Issue 12, pp. 9828-9833 (2009)
http://dx.doi.org/10.1364/OE.17.009828


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Abstract

We report, for the first time to our knowledge, a novel and simple method for measuring continuous dispersion spectrum of unclamped linear electro-optic (EO) coefficient using a white-light interferometry. This method detects phase changes of the interference patterns with and without an applied electric voltage, and allows a simultaneous measurement of wavelength and polarization dependent EO coefficients of birefringent materials. Both of the unclamped EO coefficients, r13T and r33T, of a congruent LiNbO3 (LN) crystal have been measured simultaneously with the method, and their continuous dispersion curves have been also obtained.

© 2009 OSA

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(160.3730) Materials : Lithium niobate
(190.0190) Nonlinear optics : Nonlinear optics
(190.4400) Nonlinear optics : Nonlinear optics, materials

ToC Category:
Nonlinear Optics

History
Original Manuscript: March 23, 2009
Revised Manuscript: May 1, 2009
Manuscript Accepted: May 5, 2009
Published: May 27, 2009

Citation
Seoung Hun Lee, Seung Hwan Kim, Kyong Hon Kim, Min Hee Lee, and El-Hang Lee, "A novel method for measuring continuous dispersion spectrum of electro-optic coefficients of nonlinear materials," Opt. Express 17, 9828-9833 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-12-9828


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