Midinfrared absorption measured at a λ/400 resolution with an atomic force microscope
Optics Express, Vol. 17, Issue 13, pp. 10887-10894 (2009)
http://dx.doi.org/10.1364/OE.17.010887
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Abstract
Midinfrared absorption can be locally measured using a detection combining an atomic force microscope and a pulsed excitation. This is illustrated for the midinfrared bulk GaAs phonon absorption and for the midinfrared absorption of thin SiO2 microdisks. We show that the signal given by the cantilever oscillation amplitude of the atomic force microscope follows the spectral dependence of the bulk material absorption. The absorption spatial resolution achieved with microdisks is around 50 nanometer for an optical excitation around 22 micrometer wavelength.
© 2009 Optical Society of America
OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(300.6270) Spectroscopy : Spectroscopy, far infrared
(300.6430) Spectroscopy : Spectroscopy, photothermal
(300.6470) Spectroscopy : Spectroscopy, semiconductors
ToC Category:
Microscopy
History
Original Manuscript: February 5, 2009
Revised Manuscript: March 6, 2009
Manuscript Accepted: March 16, 2009
Published: June 16, 2009
Citation
Julien Houel, Estelle Homeyer, Sébastien Sauvage, Philippe Boucaud, Alexandre Dazzi, Rui Prazeres, and Jean-Michel Ortéga, "Midinfrared absorption measured at a
λ/400 resolution with an atomic force
microscope," Opt. Express 17, 10887-10894 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-13-10887
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