Observation of a bent crystal-lattice by x-ray interferometry
Optics Express, Vol. 17, Issue 13, pp. 11172-11178 (2009)
http://dx.doi.org/10.1364/OE.17.011172
Enhanced HTML 
Acrobat PDF (460 KB)
Abstract
The capability of operating a separate crystal x-ray interferometer over centimeter displacements has made it possible to observe minute strain fields of a bent crystal at the atomic scale resolution by means of phase-contrast x-ray topography. Measurement and predictive capabilities of lattice strain are key ingredients of a highly accurate measurement of the Si lattice parameter and of a determination of the number of atoms in a realization of the mass unit based on an atom mass. Here we show that the observed strain can be accurately predicted by a finite-element analysis of the crystal deformation.
© 2009 Optical Society of America
OCIS Codes
(110.7440) Imaging systems : X-ray imaging
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(340.0340) X-ray optics : X-ray optics
(340.7450) X-ray optics : X-ray interferometry
ToC Category:
X-ray Optics
History
Original Manuscript: April 13, 2009
Revised Manuscript: May 15, 2009
Manuscript Accepted: May 20, 2009
Published: June 19, 2009
Citation
Giovanni Mana, Enrico Massa, and Luca Ferroglio, "Observation of a bent crystal-lattice by x-ray interferometry," Opt. Express 17, 11172-11178 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-13-11172
Sort: Year | Journal | Reset
References
- J. Flowers, "The route to atomic and quantum standards," Science 306, 1324-1330 (2004). [CrossRef] [PubMed]
- J. Robinson, "Weighty matter," Scientific American, 102-109 (December 2006). [CrossRef] [PubMed]
- E. Massa, G. Mana, G. U. Kuetgens, and L. Ferroglio, "Measurement of the lattice parameter of a silicon crystal," New J. Phys. 11 (2009) 053013. [CrossRef]
- U. Bonse and W. Graeff, "X-ray and neutron interferometry," in: Topics in applied physics, 22 X-ray optics, applications to solids, H.-J. Queisser ed. (Berlin, Springer, 1997).
- G. Mana and E. Vittone, "Scanning LLL x-ray interferometry I. Theory," Z. Phys. B 102, 197-206 (1997) [CrossRef]
- U. Bonse, W. Graeff, and G. Materlik, "X-ray interferometry and lattice parameter investigations," Rev. Phys. Appl. 11, 83-87 (1976). [CrossRef]
- L. Ferroglio, G. Mana, and E. Massa, "Si lattice parameter measurement by centimeter x-ray interferometry," Opt. Express 16, 16877-16888 (2008). [CrossRef] [PubMed]
- A. G. Every and A. K. Mc Curdy, Low Frequency Properties of Dielectric Crystals: Second and Higher Order Elastic Constants in: Landolt-B¨ornstein III/29a, Nelson, D. F. ed. (Springer, Berlin, 1992).
Cited By |
 Alert me when this paper is cited |
OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.
Related Journal Articles 
- Time-Resolved Ten-Channel Monochromatic Imaging of Inertial Confinement Fusion Plasmas (AO)
- Influence of Fabrication Errors on Wölter Mirror Imaging Performance (AO)
- Refractive Lenses for Coherent X-Ray Sources (AO)
- X-ray-ultraviolet beam splitters for the Michelson interferometer (AO)
- Si lattice parameter measurement by centimeter X-ray interferometry (OE)
Related Conference Papers
- Fully coherent light at 13 nm using quasi phase matching in gas-filled modulated waveguides
- Fully coherent light at 13 nm using quasi phase matching in gas-filled modulated waveguides
- Bright high-order harmonic generation at 13 nm and coherence measurement
- Integration of the Two-Dimensional Power Spectral Density into Specifications for the X-Ray Domain--Problems and Opportunities
- Coherent Imaging Nano-Patterning with Extreme Ultraviolet Laser Illumination
« Previous Article | Next Article »
OSA is a member of 