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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 16 — Aug. 3, 2009
  • pp: 14260–14269

An improved transfer-matrix model for optical superlenses

Ciaran P. Moore, Richard J. Blaikie, and Matthew D. Arnold  »View Author Affiliations

Optics Express, Vol. 17, Issue 16, pp. 14260-14269 (2009)

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The use of transfer-matrix analyses for characterizing planar optical superlensing systems is studied here, and the simple model of the planar superlens as an isolated imaging element is shown to be defective in certain situations. These defects arise due to neglected interactions between the superlens and the spatially varying shadow masks that are normally used as scattering objects for imaging, and which are held in near-field proximity to the superlenses. An extended model is proposed that improves the accuracy of the transfer-matrix analysis, without adding significant complexity, by approximating the reflections from the shadow mask by those from a uniform metal layer. Results obtained using both forms of the transfer matrix model are compared to finite element models and two example superlenses, one with a silver monolayer and the other with three silver sublayers, are characterized. The modified transfer matrix model gives much better agreement in both cases.

© 2009 OSA

OCIS Codes
(240.6680) Optics at surfaces : Surface plasmons
(260.2110) Physical optics : Electromagnetic optics
(310.6860) Thin films : Thin films, optical properties
(310.6628) Thin films : Subwavelength structures, nanostructures

ToC Category:
Thin Films

Original Manuscript: May 21, 2009
Revised Manuscript: July 21, 2009
Manuscript Accepted: July 23, 2009
Published: July 31, 2009

Ciaran P. Moore, Richard J. Blaikie, and Matthew D. Arnold, "An improved transfer-matrix 
model for optical superlenses," Opt. Express 17, 14260-14269 (2009)

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