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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 18 — Aug. 31, 2009
  • pp: 15491–15501

Characterisation of a resolution enhancing image inversion interferometer

Kai Wicker, Simon Sindbert, and Rainer Heintzmann  »View Author Affiliations


Optics Express, Vol. 17, Issue 18, pp. 15491-15501 (2009)
http://dx.doi.org/10.1364/OE.17.015491


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Abstract

Image inversion interferometers have the potential to significantly enhance the lateral resolution and light efficiency of scanning fluorescence microscopes. Self-interference of a point source’s coherent point spread function with its inverted copy leads to a reduction in the integrated signal for off-axis sources compared to sources on the inversion axis. This can be used to enhance the resolution in a confocal laser scanning microscope. We present a simple image inversion interferometer relying solely on reflections off planar surfaces. Measurements of the detection point spread function for several types of light sources confirm the predicted performance and suggest its usability for scanning confocal fluorescence microscopy.

© 2009 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(110.2970) Imaging systems : Image detection systems
(180.1790) Microscopy : Confocal microscopy
(180.2520) Microscopy : Fluorescence microscopy
(180.3170) Microscopy : Interference microscopy
(180.5810) Microscopy : Scanning microscopy

ToC Category:
Microscopy

History
Original Manuscript: March 18, 2009
Revised Manuscript: June 1, 2009
Manuscript Accepted: July 9, 2009
Published: August 18, 2009

Virtual Issues
Vol. 4, Iss. 10 Virtual Journal for Biomedical Optics

Citation
Kai Wicker, Simon Sindbert, and Rainer Heintzmann, "Characterisation of a resolution enhancing image inversion interferometer," Opt. Express 17, 15491-15501 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-18-15491


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