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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 19 — Sep. 14, 2009
  • pp: 16492–16504

Line-defect calibration for line-scanning projection display

Seungdo An, Jonghyeong Song, Anatoliy Lapchuk, Victor Yurlov, Seung-Won Ryu, Eungju Kim, and Sang Kyeong Yun  »View Author Affiliations


Optics Express, Vol. 17, Issue 19, pp. 16492-16504 (2009)
http://dx.doi.org/10.1364/OE.17.016492


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Abstract

A method of line-defect calibration for line-scanning projection display is developed to accomplish acceptable display uniformity. The line scanning display uses a line modulating imaging and scanning device to construct a two-dimensional image. The inherent line-defects in an imaging device and optical lenses are the most fatal performance-degrading factor that should be overcome to reach the basic display uniformity level. Since the human eye recognizes line defects very easily, a method that perfectly removes line defects is required. Most line imaging devices are diffractive optical devices that require a coherent light source. This particular requirement makes the calibration method of sequential single pixel measurement and correction insufficient to take out the line defects distributed on screen due to optical crosstalk. In this report, we present a calibration method using a recursively converging algorithm that successfully transforms the unacceptable line-defected images into a uniform display image.

© 2009 Optical Society of America

OCIS Codes
(100.2980) Image processing : Image enhancement
(120.1880) Instrumentation, measurement, and metrology : Detection
(120.2040) Instrumentation, measurement, and metrology : Displays
(350.4600) Other areas of optics : Optical engineering

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: October 31, 2008
Revised Manuscript: March 5, 2009
Manuscript Accepted: April 6, 2009
Published: September 1, 2009

Citation
Seungdo An, Jonghyeong Song, Anatoliy Lapchuk, Victor Yurlov, Seung-Won Ryu, Eungju Kim, and Sang Kyeong Yun, "Line-defect calibration for line-scanning projection display," Opt. Express 17, 16492-16504 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-19-16492


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