This paper presents a methodology for including the photometric raw data sets into the diffuse illumination design process. The method is based on computing the luminance distribution on the outgoing side of diffusing elements from measured bidirectional scattering distribution functions (BSDFs). The model is limited to specimens that create rotationally symmetric scattering distribution. The calculation procedure includes the linear superposition and the correcting feedback. As an application example, the method is verified by a commercially available diffusing sheet illuminated by a 32-inch backlighting module. Close agreement (correlation coefficient = 98.6%) with the experimental measurement confirmed the validity of the proposed procedure.

© 2009 Optical Society of America

1. J. C. Stover, Optical Scattering: Measurement and Analysis (Mc Graw-Hill, New York, 1990).
2. M. Nieto-Vesperinas, Scattering and Diffraction in Physical Optics (Wiley, New York, 1991).
3. L. Tsang, J. A. Kong, and K. -H. Ding, Scattering of Electromagnetic Waves, Theories and Applications (Wiley, New York, 2000). [CrossRef]
4. L. Tsang and J. A. Kong, Scattering of Electromagnetic Waves, Advanced Topiics s (Wiley, New York, 2001).
5. A. K. Fung, Microwave Scattering and Emission Models and Their Applications (Artech House, Boston, 1994).
6. A. Voronovich, "Small-slope approximation for electromagnetic wave scattering at a rough interface of two dielectric half-spaces," Waves Random Media 4, 337-367 (1994). [CrossRef]
7. A. Voronovich, Wave Scattering from Rough Surfaces, 2nd Edition (Springer-Verlag, Berlin Heidelberg, 1994).
8. K. E. Torrance and E. M. Sparrow, "Theory for off-specular reflection from roughened surface," J. Opt. Soc. Am. 57, 1105-1114 (1967). [CrossRef]
9. B. van Ginneken, M. Staveridi and J. J. Koendrik, "Diffuse and specular reflectance from rough surface," Appl. Opt. 37, 130-139 (1998). [CrossRef]
10. K. Tang and R. O. Buckius, "A statistical model of wave scattering from random rough surfaces," Int. J. Heat Mass Transfer 44, 4059-4073 (2001). [CrossRef]
11. L. Tsang, J. A. Kong, K, -H. Ding, and C. O. Ao, Scattering of Electromagnetic Waves, Numerical Simulations (Wiley, New York, 2000). [CrossRef]
12. F. D. Hastings, J. B. Schneider, and S. L. Broschat, "A Monte Carlo FDTD technique for rough surface scattering," IEEE Trans. Antennas Propag. 43, 1183-1191 (1995).
13. N. Garcia and E. Stoll, "Monte Carlo calculation for electromagnetic-wave scattering from random rough Surfaces," Phys. Rev. Lett. 52, 1798-1801 (1984). [CrossRef]
14. K. Tang, R. Dimenna, and R. Buckius, "Regions of validity of the geometric optics approximation for angular scattering from very rough surface," Int. Heat J. Mass Transfer 40, 49-59 (1997). [CrossRef]
15. M. Bass, E. W. Van Stryland, D. R. Williams, and W. L. Wolfe, Handbook of Optics, Volume II (McGraw-Hill, New York, 1991).
16. E. Kreyszig, Introductory Mathematical Statistics (Wiley, New York, 1970)
17. J. de Boer, "Modelling indoor illumination by complex fenestration systems based on bidirectional : Basics, Measurement, and Rating," J. Soc. Info. Dis. 14/11, 1003-1017 (2006).
18. M. E. Becker, "Evaluation and characterization of display reflectance," Displays 19, 35-54 (1998). [CrossRef]
19. J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill, New York, 2004)
20. K. Iizuka, Elements of Photonics I (Willey, New York, 2002)
21. A. M. Nuijs and J. J. L. Horikx, "Diffraction and scattering at antiglare structures for display devices," Appl. Opt. 33, 4058-4068 (1994). [CrossRef] [PubMed]
22. J. E. Harvey and C. L. Vernold, "Transfer function characterization of scattering surface," Proc. SPIE 3141, 113-127 (1997). [CrossRef]
23. M. W. Hodapp, Applications for High-Brightness Light-Emitting Diodes, in Semiconductors and Semimetals Vol. 48, G. B. Stringfellow and M. G. Craford ed., (Academic Press, San Diego, 1997) Semiconductors and Semimetals Vol. 48, Chap. 6, p. 227.

Appl. Opt.

• B. van Ginneken, M. Staveridi and J. J. Koendrik, "Diffuse and specular reflectance from rough surface," Appl. Opt. 37, 130-139 (1998). [CrossRef]
• A. M. Nuijs and J. J. L. Horikx, "Diffraction and scattering at antiglare structures for display devices," Appl. Opt. 33, 4058-4068 (1994). [CrossRef] [PubMed]

Displays

• M. E. Becker, "Evaluation and characterization of display reflectance," Displays 19, 35-54 (1998). [CrossRef]

IEEE Trans. Antennas Propag.

• F. D. Hastings, J. B. Schneider, and S. L. Broschat, "A Monte Carlo FDTD technique for rough surface scattering," IEEE Trans. Antennas Propag. 43, 1183-1191 (1995).

Int. Heat J. Mass Transfer

• K. Tang, R. Dimenna, and R. Buckius, "Regions of validity of the geometric optics approximation for angular scattering from very rough surface," Int. Heat J. Mass Transfer 40, 49-59 (1997). [CrossRef]

Int. J. Heat Mass Transfer

• K. Tang and R. O. Buckius, "A statistical model of wave scattering from random rough surfaces," Int. J. Heat Mass Transfer 44, 4059-4073 (2001). [CrossRef]

J. Opt. Soc. Am.

• K. E. Torrance and E. M. Sparrow, "Theory for off-specular reflection from roughened surface," J. Opt. Soc. Am. 57, 1105-1114 (1967). [CrossRef]

J. Soc. Info. Dis.

• J. de Boer, "Modelling indoor illumination by complex fenestration systems based on bidirectional : Basics, Measurement, and Rating," J. Soc. Info. Dis. 14/11, 1003-1017 (2006).

Phys. Rev. Lett.

• N. Garcia and E. Stoll, "Monte Carlo calculation for electromagnetic-wave scattering from random rough Surfaces," Phys. Rev. Lett. 52, 1798-1801 (1984). [CrossRef]

Proc. SPIE

• J. E. Harvey and C. L. Vernold, "Transfer function characterization of scattering surface," Proc. SPIE 3141, 113-127 (1997). [CrossRef]

Waves Random Media

• A. Voronovich, "Small-slope approximation for electromagnetic wave scattering at a rough interface of two dielectric half-spaces," Waves Random Media 4, 337-367 (1994). [CrossRef]

Other

• A. Voronovich, Wave Scattering from Rough Surfaces, 2nd Edition (Springer-Verlag, Berlin Heidelberg, 1994).
• L. Tsang, J. A. Kong, K, -H. Ding, and C. O. Ao, Scattering of Electromagnetic Waves, Numerical Simulations (Wiley, New York, 2000). [CrossRef]
• J. C. Stover, Optical Scattering: Measurement and Analysis (Mc Graw-Hill, New York, 1990).
• M. Nieto-Vesperinas, Scattering and Diffraction in Physical Optics (Wiley, New York, 1991).
• L. Tsang, J. A. Kong, and K. -H. Ding, Scattering of Electromagnetic Waves, Theories and Applications (Wiley, New York, 2000). [CrossRef]
• L. Tsang and J. A. Kong, Scattering of Electromagnetic Waves, Advanced Topiics s (Wiley, New York, 2001).
• A. K. Fung, Microwave Scattering and Emission Models and Their Applications (Artech House, Boston, 1994).
• M. Bass, E. W. Van Stryland, D. R. Williams, and W. L. Wolfe, Handbook of Optics, Volume II (McGraw-Hill, New York, 1991).
• E. Kreyszig, Introductory Mathematical Statistics (Wiley, New York, 1970)
• J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill, New York, 2004)
• K. Iizuka, Elements of Photonics I (Willey, New York, 2002)
• M. W. Hodapp, Applications for High-Brightness Light-Emitting Diodes, in Semiconductors and Semimetals Vol. 48, G. B. Stringfellow and M. G. Craford ed., (Academic Press, San Diego, 1997) Semiconductors and Semimetals Vol. 48, Chap. 6, p. 227.

Click here to see a list of articles that cite this paper

Related Journal Articles

• Influence of boundaries on the imaging of objects in turbid media (JOSAA)
• Photon Cross-Correlation Spectroscopy to 10-ns Resolution (AO)
• Slope Distribution of a Rough Surface Measured by Transmission Scattering and Polarization (AO)
• Temporal Autocorrelation Function for a Diffusing-Wave Spectroscopy Experiment with a Point Source and Backscattering Detection (AO)
• Photometric model of diffuse surfaces described as a distribution of interfaced Lambertian facets (AO)

Related Conference Papers

• Near field observation of a refractive index grating and a topographical grating by an optically-trapped gold particle
• Temporal characterization of ultrashort X-ray pulses using X-ray anomalous transmission
• Polarization dependence of diffuse terahertz radiation
• Improvement of detection sensitivity of absorbing heterogeneityin turbid media with scanning -line phased array system
• Application of Imaging Sphere for BSDF Measurements of Arbitrary Materials