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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 2 — Jan. 19, 2009
  • pp: 828–837

Picometer level displacement metrology with digitally enhanced heterodyne interferometry

Glenn de Vine, David S. Rabeling, Bram J. J. Slagmolen, Timothy T-Y. Lam, Sheon Chua, Danielle M. Wuchenich, David E. McClelland, and Daniel A. Shaddock  »View Author Affiliations

Optics Express, Vol. 17, Issue 2, pp. 828-837 (2009)

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Digitally enhanced heterodyne interferometry is a laser metrology technique employing pseudo-random codes phase modulated onto an optical carrier. We present the first characterization of the technique’s displacement sensitivity. The displacement of an optical cavity was measured using digitally enhanced heterodyne interferometry and compared to a simultaneous readout based on conventional Pound-Drever-Hall locking. The techniques agreed to within 5 pm/√Hz at 1 Hz, providing an upper bound to the displacement noise of digitally enhanced heterodyne interfer-ometry. These measurements employed a real-time signal extraction system implemented on a field programmable gate array, suitable for closed-loop control applications. We discuss the applicability of digitally enhanced heterodyne interferometry for lock acquisition of advanced gravitational wave detectors.

© 2009 Optical Society of America

OCIS Codes
(040.2840) Detectors : Heterodyne
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: December 4, 2008
Revised Manuscript: January 5, 2009
Manuscript Accepted: January 6, 2009
Published: January 9, 2009

Glenn de Vine, David S. Rabeling, Bram J. J. Slagmolen, Timothy T-Y. Lam, Sheon Chua, Danielle M. Wuchenich, David E. McClelland, and Daniel A. Shaddock, "Picometer level displacement metrology with digitally enhanced heterodyne interferometry," Opt. Express 17, 828-837 (2009)

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