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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 23 — Nov. 9, 2009
  • pp: 20684–20693

A terahertz time-domain spectrometer for simultaneous transmission and reflection measurements at normal incidence

Fabian D. J. Brunner, Arno Schneider, and Peter Günter  »View Author Affiliations

Optics Express, Vol. 17, Issue 23, pp. 20684-20693 (2009)

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We present a versatile terahertz time-domain spectrometer which allows reflection measurements at normal incidence and double pass transmission measurements in a single experimental setup. Two different modes for transmission measurements are demonstrated for precise measurements of transparent high or low refractive index materials, respectively. The refractive indices and absorption coefficients of cesium iodide, potassium bromide, sodium chloride, polytetrafluoroethylene (PTFE, Teflon), and silicon have been measured in the frequency range between 1.4 and 4.7 THz. The parameters of the Lorentz oscillator functions describing the phonon polariton dispersions of CsI and KBr have been determined.

© 2009 Optical Society of America

OCIS Codes
(160.2100) Materials : Electro-optical materials
(160.3220) Materials : Ionic crystals
(160.4890) Materials : Organic materials
(190.7110) Nonlinear optics : Ultrafast nonlinear optics
(040.2235) Detectors : Far infrared or terahertz
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:

Original Manuscript: September 17, 2009
Revised Manuscript: October 22, 2009
Manuscript Accepted: October 22, 2009
Published: October 27, 2009

Fabian D. J. Brunner, Arno Schneider, and Peter Günter, "A terahertz time-domain spectrometer for simultaneous transmission and reflection measurements at normal incidence," Opt. Express 17, 20684-20693 (2009)

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