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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 23 — Nov. 9, 2009
  • pp: 20714–20720

The characterization of GH shifts of surface plasmon resonance in a waveguide using the FDTD method

Geum-Yoon Oh, Doo Gun Kim, and Young-Wan Choi  »View Author Affiliations

Optics Express, Vol. 17, Issue 23, pp. 20714-20720 (2009)

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We have explicated the Goos-Hänchen (GH) shift in a μm-order Kretchmann-Raether configuration embedded in an optical waveguide structure by using the finite-difference time-domain method. For optical waveguide-type surface plasmon resonance (SPR) devices, the precise derivation of the GH shift has become critical. Artmann’s equation, which is accurate enough for bulk optics, is difficult to apply to waveguide-type SPR devices. This is because Artmann's equation, based on the differentiation of the phase shift, is inaccurate at the critical and resonance angles where drastic phase changes occur. In this study, we accurately identified both the positive and the negative GH shifts around the incidence angle of resonance. In a waveguide-type Kretchmann-Raether configuration with an Au thin film of 50 nm, positive and negative lateral shifts of −0.75 and + 1.0 μm are obtained on the SPR with the incident angles of 44.4 ° and 47.5 °, respectively, at a wavelength of 632.8 nm.

© 2009 OSA

OCIS Codes
(130.3120) Integrated optics : Integrated optics devices
(240.4350) Optics at surfaces : Nonlinear optics at surfaces
(240.6680) Optics at surfaces : Surface plasmons

ToC Category:
Optics at Surfaces

Original Manuscript: August 31, 2009
Revised Manuscript: October 1, 2009
Manuscript Accepted: October 1, 2009
Published: October 27, 2009

Geum-Yoon Oh, Doo Gun Kim, and Young-Wan Choi, "The characterization of GH shifts of surface plasmon resonance in a waveguide using the FDTD method," Opt. Express 17, 20714-20720 (2009)

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