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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 23 — Nov. 9, 2009
  • pp: 20735–20746

A generalized reference-plane-based calibration method in optical triangular profilometry

Suochao Cui and Xiao Zhu  »View Author Affiliations

Optics Express, Vol. 17, Issue 23, pp. 20735-20746 (2009)

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In this paper, a generalized reference-plane-based calibration method is proposed in optical triangular profilometry by exploring projection ray tracing method and image ray tracing method. The pin-hole camera model is used to model the camera and the projector, and parallel planes model is used to model the reference and test planes. The camera, projector, and planes can be in arbitrary positions and arbitrary directions. The reciprocal of the height and the reciprocal of the phase shift (or pixel position vertical distance) are in linear relationship. Experiments are conducted to verify the proposed method.

© 2009 OSA

OCIS Codes
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: September 1, 2009
Revised Manuscript: October 21, 2009
Manuscript Accepted: October 22, 2009
Published: October 28, 2009

Suochao Cui and Xiao Zhu, "A generalized reference-plane-based calibration method in optical triangular profilometry," Opt. Express 17, 20735-20746 (2009)

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