A generalized reference-plane-based calibration method in optical triangular profilometry
Optics Express, Vol. 17, Issue 23, pp. 20735-20746 doi:10.1364/OE.17.020735
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- OCIS Codes:
- (120.2830) Instrumentation, measurement, and metrology : Height measurements
- (120.5050) Instrumentation, measurement, and metrology : Phase measurement
- (120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
Instrumentation, Measurement, and Metrology
Citation
Suochao Cui and Xiao Zhu, "A generalized reference-plane-based calibration method in optical triangular profilometry," Opt. Express 17, 20735-20746 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-23-20735
Abstract
In this paper, a generalized reference-plane-based calibration method is proposed in optical triangular profilometry by exploring projection ray tracing method and image ray tracing method. The pin-hole camera model is used to model the camera and the projector, and parallel planes model is used to model the reference and test planes. The camera, projector, and planes can be in arbitrary positions and arbitrary directions. The reciprocal of the height and the reciprocal of the phase shift (or pixel position vertical distance) are in linear relationship. Experiments are conducted to verify the proposed method.
© 2009 OSA
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History
Original Manuscript: September 1, 2009
Manuscript Accepted: October 22, 2009
Revised Manuscript: October 21, 2009
Published: October 28, 2009
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Author Affiliations
Institute of Optoelectronics Science and Engineering, Huazhong University of Science and Technology, 1037 Luoyu Road, Wuhan, 430074, China
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