Manipulative depolarization and reflectance spectra of morphologically controlled nano-pillars and nano-rods
Optics Express, Vol. 17, Issue 23, pp. 20824-20832 (2009)
http://dx.doi.org/10.1364/OE.17.020824
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Abstract
Depolarization of sub-μm-high Si nano-pillar/nano-rod surface reflectance with morphologically controlled anti-reflection spectrum is demonstrated. Extremely small reflectance dip of 1.5% at 400-450 nm for Si nano-pillars is extraordinary when comparing with Si nano-rods, in which the reflectance vs. L/λ for Si nano-pillars coincides well with the graded-index multilayer based modeling spectrum. Alternatively, Si nano-rods preserve its flattened reflectance spectrum up to 1700 nm, whereas the Si nano-pillar surface reflectance monotonically increases to approach that of bulk Si. The destructive interference is only induced on Si nano-pillar surface with larger aspect-ratio ≥15 and small sidewall slope <7 to suppress surface reflectance at blue-green wavelength region. Anomalous depolarization observed from disordered Si nano-pillar/nano-rod surface reflection indicates that TM-mode incidence interacts with more bound electrons than TE-mode to preserve its effective dielectric permittivity less deviated from the bulk Si. The degraded depolarization ratio observed under TE-mode incidence which correlates well with a simplified bounded-electron resonance model is elucidated.
© 2009 OSA
OCIS Codes
(160.4760) Materials : Optical properties
(240.5770) Optics at surfaces : Roughness
(160.4236) Materials : Nanomaterials
ToC Category:
Materials
History
Original Manuscript: July 8, 2009
Revised Manuscript: August 16, 2009
Manuscript Accepted: August 17, 2009
Published: October 29, 2009
Citation
Gong-Ru Lin, Fan-Shuen Meng, Yi-Hao Pai, Yia-Chung Chang, and Shih-Hsin Hsu, "Manipulative depolarization and reflectance spectra of morphologically controlled nano-pillars and nano-rods," Opt. Express 17, 20824-20832 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-23-20824
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