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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 24 — Nov. 23, 2009
  • pp: 21396–21407

Rapid Mueller matrix polarimetry based on parallelized polarization state generation and detection

Santosh Tripathi and Kimani C. Toussaint, Jr.  »View Author Affiliations

Optics Express, Vol. 17, Issue 24, pp. 21396-21407 (2009)

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We present rapid Mueller matrix polarimetry that can extract twelve Muller matrix elements from a single intensity image in real time and with high spatial resolution. This is achieved by parallelizing the respective polarization state generation and polarization state detection processes, which in existing polarimeters is performed sequentially. Parallelization of the polarization state generation process is accomplished through the use of vector beams, for which this work represents a new application domain. Polarization state detection is parallelized by uniquely combining a microscope/array detector setup with a specialized algorithm that simultaneously utilizes information from multiple spatial regions of the array detector. Simulated results applying this technique to two anisotropic samples including metamaterial yield material parameters that are consistent with those reported in the literature.

© 2009 OSA

OCIS Codes
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(180.0180) Microscopy : Microscopy
(310.3840) Thin films : Materials and process characterization
(160.3918) Materials : Metamaterials
(160.4236) Materials : Nanomaterials

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: September 11, 2009
Revised Manuscript: November 1, 2009
Manuscript Accepted: November 2, 2009
Published: November 9, 2009

Santosh Tripathi and Kimani C. Toussaint, "Rapid Mueller matrix polarimetry based on parallelized polarization state generation and detection," Opt. Express 17, 21396-21407 (2009)

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