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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 25 — Dec. 7, 2009
  • pp: 22586–22602

Investigation of electrooptic modulator disruption by microwave-induced transients

Ross T. Schermer, Frank Bucholtz, Carl A. Villarruel, Jesus Gil Gil, Tim D. Andreadis, and Keith J. Williams  »View Author Affiliations

Optics Express, Vol. 17, Issue 25, pp. 22586-22602 (2009)

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This paper presents a detailed investigation of the physical mechanisms underlying the disruption of a lithium niobate electrooptic modulator by RF pulses. It is shown that short-term modulator disruption is a direct consequence of resistive heating within the metal conductor of the coplanar waveguide electrode, which leads to a thermo-optic optical phase shift in the waveguides of the modulator. Resistive heating is also shown to contribute to permanent modulator damage at higher RF power. These results indicate that short-term RF disruption, and possibly RF damage, can be mitigated through improved thermal management. They also predict that short-term photonic link disruption can be reduced, if not eliminated, by use of a phase modulated photonic link.

© 2009 OSA

OCIS Codes
(060.2360) Fiber optics and optical communications : Fiber optics links and subsystems
(130.3120) Integrated optics : Integrated optics devices
(130.3730) Integrated optics : Lithium niobate
(130.4110) Integrated optics : Modulators

ToC Category:
Integrated Optics

Original Manuscript: October 9, 2009
Revised Manuscript: November 14, 2009
Manuscript Accepted: November 15, 2009
Published: November 24, 2009

Ross T. Schermer, Frank Bucholtz, Carl A. Villarruel, Jesus Gil Gil, Tim D. Andreadis, and Keith J. Williams, "Investigation of electrooptic modulator disruption by microwave-induced transients," Opt. Express 17, 22586-22602 (2009)

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