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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 26 — Dec. 21, 2009
  • pp: 23873–23879

Measured optical constants of copper from 10 nm to 35 nm

Nicole Brimhall, Nicholas Herrick, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross  »View Author Affiliations


Optics Express, Vol. 17, Issue 26, pp. 23873-23879 (2009)
http://dx.doi.org/10.1364/OE.17.023873


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Abstract

We use laser high-order harmonics and a polarization-ratio-reflectance technique to determine the optical constants of copper and oxidized copper in the wavelength range 10-35 nm. This measurement resolves previously conflicting data sets, where disagreement on optical constants of copper in the extreme ultraviolet most likely arises from inadvertent oxidation of samples before measurement.

© 2009 Optical Society of America

OCIS Codes
(160.3900) Materials : Metals
(160.4760) Materials : Optical properties
(190.2620) Nonlinear optics : Harmonic generation and mixing
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)
(240.2130) Optics at surfaces : Ellipsometry and polarimetry

ToC Category:
Materials

History
Original Manuscript: September 28, 2009
Revised Manuscript: November 18, 2009
Manuscript Accepted: December 9, 2009
Published: December 15, 2009

Citation
Nicole Brimhall, Nicholas Herrick, David D. Allred, R. Steven Turley, Michael J. Ware, and Justin Peatross, "Measured optical constants of copper from 10 nm to 35 nm," Opt. Express 17, 23873-23879 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-26-23873


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