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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 26 — Dec. 21, 2009
  • pp: 23880–23893

Retrospective correction of nonuniform illumination on bi-level images

Hana Lee and Jeongtae Kim  »View Author Affiliations


Optics Express, Vol. 17, Issue 26, pp. 23880-23893 (2009)
http://dx.doi.org/10.1364/OE.17.023880


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Abstract

We propose a novel method for correcting the effect of nonuniform illumination on a bi-level image. The proposed method is based on a penalized nonlinear least squares objective function that measures the binariness of an image and the roughness of illumination. Compared with conventional methods, it has the advantages of 1) not suffering from a trivial minimizer, 2) not requiring tuning of design parameters, and 3) effective optimization. In addition, it yields a unique solution since the minimization of the objective function is well-posed. In simulations and experiments, the method showed better accuracy and speed than the conventional entropy-based method.

© 2009 Optical Society of America

OCIS Codes
(100.3020) Image processing : Image reconstruction-restoration
(100.3190) Image processing : Inverse problems

ToC Category:
Image Processing

History
Original Manuscript: September 30, 2009
Revised Manuscript: October 30, 2009
Manuscript Accepted: November 16, 2009
Published: December 15, 2009

Citation
Hana Lee and Jeongtae Kim, "Retrospective correction of nonuniform illumination on bi-level images," Opt. Express 17, 23880-23893 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-26-23880


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