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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 3 — Feb. 2, 2009
  • pp: 1714–1725

Investigation of the influence of the aberration induced by a plane interface on STED microscopy

Suhui Deng, Li Liu, Ya Cheng, Ruxin Li, and Zhizhan Xu  »View Author Affiliations

Optics Express, Vol. 17, Issue 3, pp. 1714-1725 (2009)

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The structure of the inhibition patterns is important to the stimulated emission depletion (STED) microscopy. Usually, Laguerre-Gaussian (LG) beam and the central zero-intensity patterns created by inserting phase masks in Gaussian beams are used as the erase beam in STED microscopy. Aberration is generated when focusing beams through an interface between the media of the mismatched refractive indices. By use of the vectorial integral, the effects of such aberration on the shape of depletion patterns and the size of fluorescence emission spot in the STED microscopy are studied. Results are presented as a comparison between the aberration-free case and the aberrated cases.

© 2009 Optical Society of America

OCIS Codes
(050.1960) Diffraction and gratings : Diffraction theory
(180.0180) Microscopy : Microscopy
(180.2520) Microscopy : Fluorescence microscopy

ToC Category:

Original Manuscript: November 14, 2008
Revised Manuscript: December 22, 2008
Manuscript Accepted: January 2, 2009
Published: January 29, 2009

Virtual Issues
Vol. 4, Iss. 4 Virtual Journal for Biomedical Optics

Suhui Deng, Li Liu, Ya Cheng, Ruxin Li, and Zhizhan Xu, "Investigation of the influence of the aberration induced by a plane interface on STED microscopy," Opt. Express 17, 1714-1725 (2009)

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