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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 5 — Mar. 2, 2009
  • pp: 3396–3406

Nonlinearities in porous silicon optical waveguides at 1550 nm

Paveen Apiratikul, Andrea M. Rossi, and Thomas E. Murphy  »View Author Affiliations


Optics Express, Vol. 17, Issue 5, pp. 3396-3406 (2009)
http://dx.doi.org/10.1364/OE.17.003396


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Abstract

We report an experimental investigation of the nonlinear optical properties of nanoporous silicon optical waveguides measured at 1550 nm. The nonlinear properties including two-photon absorption, self-phase modulation, free-carrier absorption and free-carrier plasma dispersion are characterized and compared with similar measurements conducted on a conventional silicon-on-insulator ridge waveguide. Our study reveals that even waveguides that are 70% porous exhibit two-photon absorption and self-phase modulation coefficients that are comparable to those of crystalline silicon. The free-carrier absorption and dispersion in porous silicon waveguides are found to be significantly faster, and stronger than those reported for crystalline silicon.

© 2009 Optical Society of America

OCIS Codes
(160.4330) Materials : Nonlinear optical materials
(190.4180) Nonlinear optics : Multiphoton processes
(190.5970) Nonlinear optics : Semiconductor nonlinear optics including MQW
(190.7110) Nonlinear optics : Ultrafast nonlinear optics
(230.7370) Optical devices : Waveguides
(160.4236) Materials : Nanomaterials

ToC Category:
Nonlinear Optics

History
Original Manuscript: January 5, 2009
Revised Manuscript: February 13, 2009
Manuscript Accepted: February 15, 2009
Published: February 19, 2009

Citation
Paveen Apiratikul, Andrea M. Rossi, and Thomas E. Murphy, "Nonlinearities in porous silicon optical waveguides at 1550 nm," Opt. Express 17, 3396-3406 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-5-3396


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