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Optics Express

Optics Express

  • Vol. 17, Iss. 7 — Mar. 30, 2009
  • pp: 5758–5773

An enhanced contrast to detect bulk objects under arbitrary rough surfaces

L. Arnaud, G. Georges, J. Sorrentini, M. Zerrad, C. Deumié, and C. Amra  »View Author Affiliations

Optics Express, Vol. 17, Issue 7, pp. 5758-5773 (2009)

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We study a selective light scattering elimination procedure in the case of highly scattering rough surfaces. Contrary to the case of low scattering levels, the elimination parameters are shown to depend on the sample microstructure and to present rapid variations with the scattering angle. On the other hand, when the slope of the surface is moderated, we show that this parameters present smoother variations and little dependence to the microstructure, even when the roughness is high. These results allow an important selective reduction of the scattered light, with a basic experimental mounting and an analytical determination of the elimination parameters. Such selective scattering reduction is demonstrated by simulations and experiments and applied to the imaging of an object situated under a highly rough surface.

© 2009 Optical Society of America

OCIS Codes
(120.6150) Instrumentation, measurement, and metrology : Speckle imaging
(240.5770) Optics at surfaces : Roughness
(260.2130) Physical optics : Ellipsometry and polarimetry
(290.5820) Scattering : Scattering measurements
(290.5825) Scattering : Scattering theory
(290.5855) Scattering : Scattering, polarization

ToC Category:

Original Manuscript: November 7, 2008
Revised Manuscript: December 24, 2008
Manuscript Accepted: December 25, 2008
Published: March 26, 2009

L. Arnaud, G. Georges, J. Sorrentini, M. Zerrad, C. Deumié, and C. Amra, "An enhanced contrast to detect bulk objects under arbitrary rough surfaces," Opt. Express 17, 5758-5773 (2009)

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