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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 8 — Apr. 13, 2009
  • pp: 6397–6406

Optics InfoBase > Optics Express > Volume 17 > Issue 8 > Page 6397

Polarization dependence of Z-scan measurement: theory and experiment

Xiao-Qing Yan, Zhi-Bo Liu, Xiao-Liang Zhang, Wen-Yuan Zhou, and Jian-Guo Tian  »View Author Affiliations


Optics Express, Vol. 17, Issue 8, pp. 6397-6406 (2009)
http://dx.doi.org/10.1364/OE.17.006397


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Abstract

Here we report on an extension of common Z-scan method to arbitrary polarized incidence light for measurements of anisotropic third-order nonlinear susceptibility in isotropic medium. The normalized transmittance formulas of closed-aperture Z-scan are obtained for linearly, elliptically and circularly polarized incidence beam. The theoretical analysis is examined experimentally by studying third-order nonlinear susceptibility of CS2 liquid. Results show that the elliptically polarized light Z-scan method can be used to measure simultaneously the two third-order nonlinear susceptibility components χxyyx (3) and χxxyy (3). Furthermore, the elliptically polarized light Z-scan measurements of large nonlinear phase shift are also analyzed theoretically and experimentally.

© 2009 Optical Society of America

OCIS Codes
(190.0190) Nonlinear optics : Nonlinear optics
(190.3270) Nonlinear optics : Kerr effect
(190.4710) Nonlinear optics : Optical nonlinearities in organic materials

ToC Category:
Nonlinear Optics

History
Original Manuscript: February 4, 2009
Revised Manuscript: March 15, 2009
Manuscript Accepted: March 15, 2009
Published: April 2, 2009

Citation
Xiao-Qing Yan, Zhi-Bo Liu, Xiao-Liang Zhang, Wen-Yuan Zhou, and Jian-Guo Tian, "Polarization dependence of Z-scan measurement: theory and experiment," Opt. Express 17, 6397-6406 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-8-6397


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