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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 17, Iss. 9 — Apr. 27, 2009
  • pp: 7368–7376

Nonlinear optical properties of Phosphorous-doped Si nanocrystals embedded in phosphosilicate glass thin films

Kenji Imakita, Masahiko Ito, Minoru Fujii, and Shinji Hayashi  »View Author Affiliations


Optics Express, Vol. 17, Issue 9, pp. 7368-7376 (2009)
http://dx.doi.org/10.1364/OE.17.007368


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Abstract

Nonlinear optical properties of phosphorus (P) -doped silicon (Si) nanocrystals are studied by z-scan technique in femtosecond regime at around 1.6 eV. The nonlinear refractive index (n2) and nonlinear absorption coefficient (β) of Si-ncs are significantly enhanced by P-doping. The enhancement of n2 is accompanied by the increase of the linear absorption in the same energy region, suggesting that impurity-related energy states are responsible for the enhancement of the nonlinear optical response.

© 2009 Optical Society of America

OCIS Codes
(190.0190) Nonlinear optics : Nonlinear optics
(190.4720) Nonlinear optics : Optical nonlinearities of condensed matter

ToC Category:
Nonlinear Optics

History
Original Manuscript: March 9, 2009
Revised Manuscript: April 10, 2009
Manuscript Accepted: April 13, 2009
Published: April 20, 2009

Citation
Kenji Imakita, Masahiko Ito, Minoru Fujii, and Shinji Hayashi, "Nonlinear optical properties of Phosphorous-doped Si nanocrystals embedded in phosphosilicate glass thin films," Opt. Express 17, 7368-7376 (2009)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-17-9-7368


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