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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 10 — May. 10, 2010
  • pp: 10270–10281

Modified elliptically polarized light Z-scan method for studying third-order nonlinear susceptibility components

Xiao-Qing Yan, Zhi-Bo Liu, Xiao-Liang Zhang, Wei-Ping Zang, and Jian-Guo Tian  »View Author Affiliations


Optics Express, Vol. 18, Issue 10, pp. 10270-10281 (2010)
http://dx.doi.org/10.1364/OE.18.010270


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Abstract

The normal elliptically polarized light Z-scan method is modified by adding a quarter-wave plate and an analyzer before the detector. The normalized transmittance formulas of modified elliptically polarized light Z-scan are obtained for media with negligible nonlinear absorption. Compared with normal linearly and elliptically polarized light Z-scan methods, an increase of sensitivity by a factor of larger than 4 is achieved for the real part of third-order susceptibility component’s measurements using this modified elliptically polarized light Z-scan method. The analytical results are verified by studying the real part of independent susceptibility components of CS2 liquid. Moreover, the potential application for cross-polarized wave generation is discussed.

© 2010 OSA

OCIS Codes
(190.0190) Nonlinear optics : Nonlinear optics
(190.4710) Nonlinear optics : Optical nonlinearities in organic materials

ToC Category:
Nonlinear Optics

History
Original Manuscript: February 3, 2010
Revised Manuscript: March 12, 2010
Manuscript Accepted: March 13, 2010
Published: May 3, 2010

Citation
Xiao-Qing Yan, Zhi-Bo Liu, Xiao-Liang Zhang, Wei-Ping Zang, and Jian-Guo Tian, "Modified elliptically polarized light Z-scan method for studying third-order nonlinear susceptibility components," Opt. Express 18, 10270-10281 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-10-10270


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