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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 10 — May. 10, 2010
  • pp: 10685–10693

Analysis of surface-plasmon-polaritons-assisted interference imaging by using silver film with rough surface

Sha Shi, Zhiyou Zhang, Mingyang He, Xupeng Li, Jing Yang, and Jinglei Du  »View Author Affiliations


Optics Express, Vol. 18, Issue 10, pp. 10685-10693 (2010)
http://dx.doi.org/10.1364/OE.18.010685


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Abstract

In the surface plasmon polaritons (SPPs) interference lithography, the scattering effect caused by the rough surface of silver film deteriorates the quality of lithography patterns. Research shows that under this condition the light field in the photoresist is not the results of SPPs interference but comes from the SPPs assisted imaging in which the scattered light propagates from the upper surface of the silver film to the photoresist. The near-field optical transfer function (NOTF) is used to study this process and a method of evaluating the imaging quality is presented. The validity of NOTF is verified by both SPPs assisted interference imaging experiments and simulations by the FDTD. It is also shown that the NOTF method is not only a convenient approach to describe the nano-scale information transmission in the near-field but also a good method to optimize experimental parameters.

© 2010 OSA

OCIS Codes
(100.0100) Image processing : Image processing
(240.6680) Optics at surfaces : Surface plasmons
(310.6628) Thin films : Subwavelength structures, nanostructures

ToC Category:
Optics at Surfaces

History
Original Manuscript: April 6, 2010
Revised Manuscript: April 27, 2010
Manuscript Accepted: April 28, 2010
Published: May 6, 2010

Citation
Sha Shi, Zhiyou Zhang, Mingyang He, Xupeng Li, Jing Yang, and Jinglei Du, "Analysis of surface-plasmon-polaritons-assisted interference imaging by using silver film with rough surface," Opt. Express 18, 10685-10693 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-10-10685


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