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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 12 — Jun. 7, 2010
  • pp: 12239–12248

Optics InfoBase > Optics Express > Volume 18 > Issue 12 > Page 12239

An optically-interrogated microwave-Poynting-vector sensor using cadmium manganese telluride

Chia-Chu Chen and John F. Whitaker  »View Author Affiliations


Optics Express, Vol. 18, Issue 12, pp. 12239-12248 (2010)
http://dx.doi.org/10.1364/OE.18.012239


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Abstract

A single <110> cadmium-manganese-telluride crystal that exhibits both the Pockels and Faraday effects is used to produce a Poynting-vector sensor for signals in the microwave regime. This multi-birefringent crystal can independently measure either electric or magnetic fields through control of the polarization of the optical probe beam. After obtaining all the relevant electric and magnetic field components, a map of the Poynting vector along a 50-Ω microstrip was experimentally determined without the need for any further transformational calculations. The results demonstrate that this sensor can be used for near-field mapping of the Poynting vector. Utilizing both amplitude and phase information from the fields in the microwave signal, it was confirmed for the case of an open-terminated microstrip that no energy flowed to the load, while for a microstrip with a matched termination, the energy flowed consistently along the transmission line.

© 2010 OSA

OCIS Codes
(320.7100) Ultrafast optics : Ultrafast measurements
(280.4788) Remote sensing and sensors : Optical sensing and sensors

ToC Category:
Sensors

History
Original Manuscript: April 9, 2010
Revised Manuscript: May 12, 2010
Manuscript Accepted: May 13, 2010
Published: May 25, 2010

Citation
Chia-Chu Chen and John F. Whitaker, "An optically-interrogated microwave-Poynting-vector sensor using cadmium manganese telluride," Opt. Express 18, 12239-12248 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-12-12239


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