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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 12 — Jun. 7, 2010
  • pp: 12872–12889

High order statistics based blind deconvolution of bi-level images with unknown intensity values

Jeongtae Kim and Soohyun Jang  »View Author Affiliations


Optics Express, Vol. 18, Issue 12, pp. 12872-12889 (2010)
http://dx.doi.org/10.1364/OE.18.012872


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Abstract

We propose a novel linear blind deconvolution method for bi-level images. The proposed method seeks an optimal point spread function and two parameters that maximize a high order statistics based objective function. Unlike existing minimum entropy deconvolution and least squares minimization methods, the proposed method requires neither unrealistic assumption that the pixel values of a bi-level image are independently identically distributed samples of a random variable nor tuning of regularization parameters. We demonstrate the effectiveness of the proposed method in simulations and experiments.

© 2010 Optical Society of America

OCIS Codes
(100.3020) Image processing : Image reconstruction-restoration
(100.3190) Image processing : Inverse problems
(100.1455) Image processing : Blind deconvolution

ToC Category:
Image Processing

History
Original Manuscript: March 1, 2010
Revised Manuscript: April 23, 2010
Manuscript Accepted: May 25, 2010
Published: June 1, 2010

Citation
Jeongtae Kim and Soohyun Jang, "High order statistics based blind deconvolution of bi-level images with unknown intensity values," Opt. Express 18, 12872-12889 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-12-12872


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