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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 14 — Jul. 5, 2010
  • pp: 14944–14949

1x3 beam splitter for TE polarization based on self-imaging phenomena in photonic crystal waveguides

Min Zhang, Radu Malureanu, Asger Christian Krüger, and Martin Kristensen  »View Author Affiliations


Optics Express, Vol. 18, Issue 14, pp. 14944-14949 (2010)
http://dx.doi.org/10.1364/OE.18.014944


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Abstract

Based on inspiration from multi-mode interference self-imaging and theoretical FDTD simulations, a 1x3 beam splitter was designed, fabricated and characterized. Measurements show that for TE-polarized incident light the power is distributed equally between the output ports within 1dB in the range from 1541nm to 1552nm, and the total transmission of the 1x3 splitter is equal to the corresponding length of a single-line-defect PhCW within the measurement uncertainty.

© 2010 OSA

OCIS Codes
(130.3120) Integrated optics : Integrated optics devices
(230.7390) Optical devices : Waveguides, planar
(130.5296) Integrated optics : Photonic crystal waveguides

ToC Category:
Integrated Optics

History
Original Manuscript: April 14, 2010
Revised Manuscript: June 14, 2010
Manuscript Accepted: June 22, 2010
Published: June 29, 2010

Citation
Min Zhang, Radu Malureanu, Asger Christian Krüger, and Martin Kristensen, "1x3 beam splitter for TE polarization based on self-imaging phenomena in photonic crystal waveguides," Opt. Express 18, 14944-14949 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-14-14944


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