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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 15 — Jul. 19, 2010
  • pp: 15597–15602

Domain wall characterization in ferroelectrics by using localized nonlinearities

Xuewei Deng and Xianfeng Chen  »View Author Affiliations


Optics Express, Vol. 18, Issue 15, pp. 15597-15602 (2010)
http://dx.doi.org/10.1364/OE.18.015597


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Abstract

In this paper, a method of domain wall characterization in ferroelectrics through Cherenkov second harmonic generation by localized nonlinearities is proposed. By this method, domain wall width is estimated to be less than 10nm. High spatial angular resolution of about 10mrad in the experiment reveals the fine structures of the domain walls. Combined with scanning techniques, this method can reconstruct domain wall patterns with high resolution. This method has advantages of being nondestructive, noncontact, in situ as well as of high resolution.

© 2010 OSA

OCIS Codes
(160.2260) Materials : Ferroelectrics
(190.1900) Nonlinear optics : Diagnostic applications of nonlinear optics
(190.2620) Nonlinear optics : Harmonic generation and mixing
(190.4400) Nonlinear optics : Nonlinear optics, materials

ToC Category:
Nonlinear Optics

History
Original Manuscript: March 19, 2010
Revised Manuscript: May 9, 2010
Manuscript Accepted: June 7, 2010
Published: July 8, 2010

Citation
Xuewei Deng and Xianfeng Chen, "Domain wall characterization in ferroelectrics by using localized nonlinearities," Opt. Express 18, 15597-15602 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-15-15597


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