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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 15 — Jul. 19, 2010
  • pp: 15725–15731

Phase-sensitive imaging of diffracted light by single nanoslits: measurements from near to far field

Hyun-woo Kihm, Q. H. Kim, D. S. Kim, K. J. Ahn, and J. H. Kang  »View Author Affiliations


Optics Express, Vol. 18, Issue 15, pp. 15725-15731 (2010)
http://dx.doi.org/10.1364/OE.18.015725


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Abstract

We perform phase-sensitive imaging of optical wavefront emanating from a single nanoslit and propagating into free space by using scattering type near-field scanning optical microscope combined with an optical interferometer. By analyzing polarization resolved optical amplitudes and phases, the propagation directions of surface waves are determined and the phase difference between two orthogonal polarization components of the surface wave are discussed for increasing distance from the slit.

© 2010 Optical Society of America

OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(240.6690) Optics at surfaces : Surface waves
(110.3175) Imaging systems : Interferometric imaging

ToC Category:
Diffraction and Gratings

History
Original Manuscript: May 12, 2010
Revised Manuscript: July 1, 2010
Manuscript Accepted: July 1, 2010
Published: July 9, 2010

Citation
Hyun-woo Kihm, Q. H. Kihm, D. S. Kim, K. J. Ahn, and J. H. Kang, "Phase-sensitive imaging of diffracted light by single nanoslits: measurements from near to far field," Opt. Express 18, 15725-15731 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-15-15725


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References

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