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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 15 — Jul. 19, 2010
  • pp: 16146–16155

Subwavelength grating crossings for silicon wire waveguides

Przemek J. Bock, Pavel Cheben, Jens H. Schmid, Jean Lapointe, André Delâge, Dan-Xia Xu, Siegfried Janz, Adam Densmore, and Trevor J. Hall  »View Author Affiliations


Optics Express, Vol. 18, Issue 15, pp. 16146-16155 (2010)
http://dx.doi.org/10.1364/OE.18.016146


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Abstract

We report on the design, simulation and experimental demonstration of a new type of waveguide crossing based on subwavelength gratings in silicon waveguides. We used 3D finite-difference time-domain simulations to minimize loss, crosstalk and polarization dependence. Measurement of fabricated devices show that our waveguide crossings have a loss as low as −0.023 dB/crossing, polarization dependent loss of < 0.02 dB and crosstalk <-40 dB.

© 2010 OSA

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(130.3120) Integrated optics : Integrated optics devices
(050.6624) Diffraction and gratings : Subwavelength structures

ToC Category:
Integrated Optics

History
Original Manuscript: April 23, 2010
Revised Manuscript: June 15, 2010
Manuscript Accepted: June 16, 2010
Published: July 15, 2010

Citation
Przemek J. Bock, Pavel Cheben, Jens H. Schmid, Jean Lapointe, André Delâge, Dan-Xia Xu, Siegfried Janz, Adam Densmore, and Trevor J. Hall, "Subwavelength grating crossings for silicon wire waveguides," Opt. Express 18, 16146-16155 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-15-16146


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