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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 16 — Aug. 2, 2010
  • pp: 16805–16812

Detection of embedded ultra-subwavelength-thin dielectric features using elongated photonic nanojets

César Méndez Ruiz and Jamesina J. Simpson  »View Author Affiliations

Optics Express, Vol. 18, Issue 16, pp. 16805-16812 (2010)

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Photonic nanojets have been previously shown (both theoretically and experimentally) to be highly sensitive to the presence of an ultra-subwavelength nanoscale particle within the nanojet. In the present work, photonic nanojets elongated by almost an order of magnitude (relative to the latest previously published work) are found to possess another key characteristic: they are sensitive to the presence of ultra-subwavelength nanoscale thin features embedded within a dielectric object. This additional characteristic of photonic nanojets is demonstrated through comparisons between fundamentally different 3-D and corresponding 1-D full Maxwell’s equations finite-difference time-domain (FDTD) models.

© 2010 OSA

OCIS Codes
(170.0170) Medical optics and biotechnology : Medical optics and biotechnology
(170.1530) Medical optics and biotechnology : Cell analysis

ToC Category:
Physical Optics

Original Manuscript: June 15, 2010
Revised Manuscript: July 5, 2010
Manuscript Accepted: July 13, 2010
Published: July 23, 2010

Virtual Issues
Vol. 5, Iss. 12 Virtual Journal for Biomedical Optics

César Méndez Ruiz and Jamesina J. Simpson, "Detection of embedded ultra-subwavelength-thin dielectric features using elongated photonic nanojets," Opt. Express 18, 16805-16812 (2010)

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