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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 16 — Aug. 2, 2010
  • pp: 17484–17497

Highly simplified device for measuring the intensity and phase of picosecond pulses

Jacob Cohen, Dongjoo Lee, Vikrant Chauhan, Peter Vaughan, and Rick Trebino  »View Author Affiliations


Optics Express, Vol. 18, Issue 16, pp. 17484-17497 (2010)
http://dx.doi.org/10.1364/OE.18.017484


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Abstract

We demonstrate an extremely simple frequency-resolved-optical-gating (GRENOUILLE) device for measuring the intensity and phase of relatively long—ps—pulses. In order to achieve the required high spectral resolution and large temporal range, it uses a few-cm-thick second-harmonic-generation crystal in the shape of a pentagon. This has the additional advantage of reducing the device’s total number of components to as few as three simple easily aligned optics, making it the simplest device ever developed for complete pulse measurement. We report complete intensity-and-phase measurements of pulses up to 15ps long with a time-bandwidth product of 21.

© 2010 OSA

OCIS Codes
(320.0320) Ultrafast optics : Ultrafast optics
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Ultrafast Optics

History
Original Manuscript: May 27, 2010
Revised Manuscript: July 17, 2010
Manuscript Accepted: July 21, 2010
Published: July 30, 2010

Citation
Jacob Cohen, Dongjoo Lee, Vikrant Chauhan, Peter Vaughan, and Rick Trebino, "Highly simplified device for measuring the intensity and phase of picosecond pulses," Opt. Express 18, 17484-17497 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-16-17484


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