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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 16 — Aug. 2, 2010
  • pp: 17542–17547

OPD measurement and dispersion reduction in a monolithic interferometer

Brian Hicks, Timothy Cook, Benjamin Lane, and Supriya Chakrabarti  »View Author Affiliations

Optics Express, Vol. 18, Issue 16, pp. 17542-17547 (2010)

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We describe a white light fringe scanning and pupil bisecting method of measuring the optical path difference (OPD) between arms of a monolithic nulling interferometer that is designed to enable direct imaging of planetary companions and the environments around nearby stars. This measurement is used to determine the differential thicknesses of optically contacted compensator plates used to reduce OPD, which can drastically impair the optic’s performance in broadband light. By making this correction, we were able to reduce the initial OPD from 949±44 nm to 63±10 nm. In the absence of any other asymmetries that can compromise the null, such a correction corresponds to an increase in an R-band (λc = 648nm) nulling bandpass from monochromatic to 25%.

© 2010 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(220.4610) Optical design and fabrication : Optical fabrication
(260.2030) Physical optics : Dispersion
(260.3160) Physical optics : Interference
(350.1260) Other areas of optics : Astronomical optics

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: June 14, 2010
Revised Manuscript: July 27, 2010
Manuscript Accepted: July 28, 2010
Published: July 30, 2010

Brian Hicks, Timothy Cook, Benjamin Lane, and Supriya Chakrabarti, "OPD measurement and dispersion reduction in a monolithic interferometer," Opt. Express 18, 17542-17547 (2010)

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