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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 17 — Aug. 16, 2010
  • pp: 18249–18253

Determination of paraxial image plane location by using Ronchi test

Jinhun Jeong, Byongchan Lee, and Sukmock Lee  »View Author Affiliations


Optics Express, Vol. 18, Issue 17, pp. 18249-18253 (2010)
http://dx.doi.org/10.1364/OE.18.018249


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Abstract

A method to determine the location of the paraxial image plane of an imaging system is discussed. This method uses a recently developed quantitative Ronchi test and is different in that the location of paraxial image plane of the system can be determined from the measured Ronchigrams alone. We validate the location determined by the method by modifying the optical setup and comparing the retrieved f-number of the system to the theoretical prediction.

© 2010 OSA

OCIS Codes
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: May 13, 2010
Revised Manuscript: July 30, 2010
Manuscript Accepted: August 2, 2010
Published: August 10, 2010

Citation
Jinhun Jeong, Byongchan Lee, and Sukmock Lee, "Determination of paraxial image plane location by using Ronchi test," Opt. Express 18, 18249-18253 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-17-18249


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References

  1. C. Donald, O’Shea, Elements of Modern Optical Design, John Wiley & Sons, New York (1985).
  2. P. Mouroulis, and J. Macdonald, Geometrical Optics and Optical Design, Oxford University Press, New York (1997).
  3. R. R. Shannon, The Art and Science of Optical Design, Cambridge University Press, Cambridge (1997).
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  5. For example,Y. Nakano and K. Murata, “Talbot interferometry for measuring the focal length of a lens,” Appl. Opt. 24(19), 3162 (1985). [CrossRef] [PubMed]
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  8. There are many different conventions, but we followed the one in J. C. Wyant and K. Creath, “Basic Wavefront Aberration Theory for Optical Metrology,” in Applied Optics and Optical Engineering, XI, 1992, Academic Press, Inc.

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