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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 17 — Aug. 16, 2010
  • pp: 18419–18424

Near-field THz imaging of free induction decay from a tyrosine crystal

A. Doi, F. Blanchard, H. Hirori, and K. Tanaka  »View Author Affiliations


Optics Express, Vol. 18, Issue 17, pp. 18419-18424 (2010)
http://dx.doi.org/10.1364/OE.18.018419


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Abstract

We demonstrate images of free induction decay (FID) signals from a grain of tyrosine in the near-field of the THz frequency region. By combining electro-optic sampling with a charge-coupled-device (CCD) camera, our near-field THz microscope allows us to visualize the electric field blinking with the FID signal with spatial resolution of better than 70 μm. The oscillating frequency of the FID signal centered at ~1 THz corresponds to the vibrational mode of the tyrosine crystal. These results confirm that the THz near-field microscope can take spectroscopic images with subwavelength spatial resolution (~λ/4).

© 2010 OSA

OCIS Codes
(320.7160) Ultrafast optics : Ultrafast technology
(180.4243) Microscopy : Near-field microscopy
(110.6795) Imaging systems : Terahertz imaging

ToC Category:
Imaging Systems

History
Original Manuscript: June 2, 2010
Revised Manuscript: July 16, 2010
Manuscript Accepted: August 5, 2010
Published: August 12, 2010

Citation
A. Doi, F. Blanchard, H. Hirori, and K. Tanaka, "Near-field THz imaging of free induction decay from a tyrosine crystal," Opt. Express 18, 18419-18424 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-17-18419


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