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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 17 — Aug. 16, 2010
  • pp: 18438–18452

Time-domain measurement of optical transport in silicon micro-ring resonators

Wolfram H. P. Pernice, Mo Li, and Hong X. Tang  »View Author Affiliations


Optics Express, Vol. 18, Issue 17, pp. 18438-18452 (2010)
http://dx.doi.org/10.1364/OE.18.018438


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Abstract

We perform time-domain measurements of optical transport dynamics in silicon nano-photonic devices. Using pulsed optical excitation the thermal and carrier induced optical nonlinearities of micro-ring resonators are investigated, allowing for identification of their individual contributions. Under pulsed excitation build-up of free carriers and heat in the waveguides leads to a beating oscillation of the cavity resonance frequency. When employing a burst of pulse trains shorter than the carrier life-time, the slower heating effect can be separated from the faster carrier effect. Our scheme provides a convenient way to thermally stabilize optical resonators for high-power time-domain applications and nonlinear optical conversion.

© 2010 OSA

OCIS Codes
(130.3120) Integrated optics : Integrated optics devices
(190.4390) Nonlinear optics : Nonlinear optics, integrated optics
(350.4238) Other areas of optics : Nanophotonics and photonic crystals

ToC Category:
Integrated Optics

History
Original Manuscript: June 22, 2010
Revised Manuscript: August 9, 2010
Manuscript Accepted: August 10, 2010
Published: August 12, 2010

Citation
Wolfram H. P. Pernice, Mo Li, and Hong X. Tang, "Time-domain measurement of optical transport in silicon micro-ring resonators," Opt. Express 18, 18438-18452 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-17-18438


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