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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 17 — Aug. 16, 2010
  • pp: 18498–18505

Femtowatt-light-level phase measurement of slow light pulses via beat-note interferometer

Hsiang-Yu Lo, Po-Ching Su, Yu-Wei Cheng, Pin-I Wu, and Yong-Fan Chen  »View Author Affiliations


Optics Express, Vol. 18, Issue 17, pp. 18498-18505 (2010)
http://dx.doi.org/10.1364/OE.18.018498


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Abstract

We report on an experimental demonstration of applying the beat-note interferometer to simultaneously measure the phase and amplitude variations of light pulses after propagating through an electromagnetically induced transparency medium at femtowatt-light levels. Furthermore, we observe that the measured phase noise approaches the shot-noise level arising from the fluctuations of detected photons.

© 2010 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(020.3320) Atomic and molecular physics : Laser cooling

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: June 17, 2010
Revised Manuscript: August 5, 2010
Manuscript Accepted: August 11, 2010
Published: August 13, 2010

Citation
Hsiang-Yu Lo, Po-Ching Su, Yu-Wei Cheng, Pin-I Wu, and Yong-Fan Chen, "Femtowatt-light-level phase measurement of slow light pulses via beat-note interferometer," Opt. Express 18, 18498-18505 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-17-18498


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