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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 18 — Aug. 30, 2010
  • pp: 18525–18531

Validation of quantitative Ronchi test through numerical propagation

Sukmock Lee and Manuel Guizar-Sicairos  »View Author Affiliations


Optics Express, Vol. 18, Issue 18, pp. 18525-18531 (2010)
http://dx.doi.org/10.1364/OE.18.018525


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Abstract

We validate the quantitative analysis of Ronchigrams for wavefront sensing through detailed numerical simulations. Analysis of the experimental Ronchigrams provides the wavefront aberrations, the F/# of the beam and the distance of the Ronchi ruling from the paraxial focus. These retrieved parameters are used to numerically simulate the Ronchigrams with excellent agreement. This favorable comparison validates the accuracy of the wavefront recovery and provides a tool to examine the accuracy and robustness of this wavefront measurement technique.

© 2010 OSA

OCIS Codes
(100.5070) Image processing : Phase retrieval
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: May 27, 2010
Revised Manuscript: August 10, 2010
Manuscript Accepted: August 10, 2010
Published: August 16, 2010

Citation
Sukmock Lee and Manuel Guizar-Sicairos, "Validation of quantitative Ronchi test through numerical propagation," Opt. Express 18, 18525-18531 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-18-18525


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References

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  2. M. Guizar-Sicairos and J. R. Fienup, “Measurement of coherent x-ray focused beams by phase retrieval with transverse translation diversity,” Opt. Express 17(4), 2670–2685 (2009). [CrossRef] [PubMed]
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  4. S. Lee and J. Sasian, “Ronchigram quantification via a non-complementary dark-space effect,” Opt. Express 17(3), 1854–1858 (2009). [CrossRef] [PubMed]
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  8. J. Jeong, B. Lee, and S. Lee, “Determination of paraxial image plane location by using Ronchi test,” Opt. Express . 18(17) 18249-18253 (2010). [CrossRef] [PubMed]
  9. There are many different conventions, but we followed the one in J. C. Wyant and K. Creath, “Basic Wavefront Aberration Theory for Optical Metrology,” in Applied Optics and Optical Engineering, XI, 1992, Academic Press, Inc.
  10. J. W. Goodman, Introduction to Fourier Optics, 3rd Ed. (Roberts & Company, Englewood, 2005).
  11. D. Malacara, Optical Shop Testing, 2nd Ed., Ch. 9 (A Wiley-Interscience Publication, 1992).

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