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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 18 — Aug. 30, 2010
  • pp: 18598–18614

Data preparation and evaluation techniques for x-ray diffraction microscopy

Jan Steinbrener, Johanna Nelson, Xiaojing Huang, Stefano Marchesini, David Shapiro, Joshua J Turner, and Chris Jacobsen  »View Author Affiliations


Optics Express, Vol. 18, Issue 18, pp. 18598-18614 (2010)
http://dx.doi.org/10.1364/OE.18.018598


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Abstract

The post-experiment processing of X-ray Diffraction Microscopy data is often time-consuming and difficult. This is mostly due to the fact that even if a preliminary result has been reconstructed, there is no definitive answer as to whether or not a better result with more consistently retrieved phases can still be obtained. We show here that the first step in data analysis, the assembly of two-dimensional diffraction patterns from a large set of raw diffraction data, is crucial to obtaining reconstructions of highest possible consistency. We have developed software that automates this process and results in consistently accurate diffraction patterns. We have furthermore derived some criteria of validity for a tool commonly used to assess the consistency of reconstructions, the phase retrieval transfer function, and suggest a modified version that has improved utility for judging reconstruction quality.

© 2010 Optical Society of America

OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(110.4280) Imaging systems : Noise in imaging systems
(110.7440) Imaging systems : X-ray imaging
(110.3010) Imaging systems : Image reconstruction techniques

ToC Category:
X-ray Optics

History
Original Manuscript: June 25, 2010
Revised Manuscript: August 7, 2010
Manuscript Accepted: August 10, 2010
Published: August 16, 2010

Virtual Issues
Vol. 5, Iss. 13 Virtual Journal for Biomedical Optics

Citation
Jan Steinbrener, Johanna Nelson, Xiaojing Huang, Stefano Marchesini, David Shapiro, Joshua J. Turner, and Chris Jacobsen, "Data preparation and evaluation techniques for x-ray diffraction microscopy," Opt. Express 18, 18598-18614 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-18-18598


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