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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 18 — Aug. 30, 2010
  • pp: 18912–18921

Laser-gain scanning microscopy: a new characterization technique for dopant engineered gain media

Jeff A. Wisdom, Romain M. Gaume, and Robert L. Byer  »View Author Affiliations


Optics Express, Vol. 18, Issue 18, pp. 18912-18921 (2010)
http://dx.doi.org/10.1364/OE.18.018912


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Abstract

We demonstrate an optical technique, called laser-gain scanning microscopy (LGSM), to map dopant concentration profiles in engineered laser gain-media. The performance and application range of this technique are exampled on a Nd3+ concentration profile embedded in a YAG transparent ceramic sample. Concentration profiles measured by both LGSM and SIMS techniques are compared and agree to within 5% over three-orders of magnitude in Nd3+ doping level, from 0.001 at.% to 0.9 at.%. One of the unique advantages of LGSM over common physical methods such as SIMS, XPS and EMPA, is the ability to correlate optical defects with the final doping profile.

© 2010 OSA

OCIS Codes
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(160.3380) Materials : Laser materials
(180.5810) Microscopy : Scanning microscopy

ToC Category:
Materials

History
Original Manuscript: April 23, 2010
Revised Manuscript: May 6, 2010
Manuscript Accepted: May 7, 2010
Published: August 20, 2010

Citation
Jeff A. Wisdom, Romain M. Gaume, and Robert L. Byer, "Laser-gain scanning microscopy: a new characterization technique for dopant engineered gain media," Opt. Express 18, 18912-18921 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-18-18912


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