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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 19 — Sep. 13, 2010
  • pp: 19532–19540

Measurement of nonreciprocal spontaneous Raman scattering in Silicon photonic wires

Jost Müller, Michael Krause, Hagen Renner, and Ernst Brinkmeyer  »View Author Affiliations


Optics Express, Vol. 18, Issue 19, pp. 19532-19540 (2010)
http://dx.doi.org/10.1364/OE.18.019532


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Abstract

We report on measurements that show the strength of the spontaneous Raman scattering in strongly confining silicon waveguides to depend significantly on the propagation direction of the amplified signal wave with respect to the pump wave. Furthermore, the strength of this nonreciprocity depends on the orientation of the waveguide with respect to the crystallographic axes. We find that when changing the orientation from 〈011〉 to 〈001〉, the Raman-induced nonreciprocity increases by almost a factor of 3.

© 2010 OSA

OCIS Codes
(230.3240) Optical devices : Isolators
(230.7370) Optical devices : Waveguides
(250.3140) Optoelectronics : Integrated optoelectronic circuits

ToC Category:
Optical Devices

History
Original Manuscript: August 5, 2010
Revised Manuscript: August 26, 2010
Manuscript Accepted: August 27, 2010
Published: August 30, 2010

Citation
Jost Müller, Michael Krause, Hagen Renner, and Ernst Brinkmeyer, "Measurement of nonreciprocal spontaneous Raman scattering in Silicon photonic wires," Opt. Express 18, 19532-19540 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-19-19532


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