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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 19 — Sep. 13, 2010
  • pp: 19743–19754

Ultrafast 3-D shape measurement with an off-the-shelf DLP projector

Yuanzheng Gong and Song Zhang  »View Author Affiliations

Optics Express, Vol. 18, Issue 19, pp. 19743-19754 (2010)

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This paper presents a technique that reaches 3-D shape measurement speed beyond the digital-light-processing (DLP) projector’s projection speed. In particular, a “solid-state” binary structured pattern is generated with each micro-mirror pixel always being at one status (ON or OFF). By this means, any time segment of projection can represent the whole signal, thus the exposure time can be shorter than the projection time. A sinusoidal fringe pattern is generated by properly defocusing a binary one, and the Fourier fringe analysis means is used for 3-D shape recovery. We have successfully reached 4,000 Hz rate (80 µs exposure time) 3-D shape measurement speed with an off-the-shelf DLP projector.

© 2010 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: July 8, 2010
Revised Manuscript: August 20, 2010
Manuscript Accepted: August 21, 2010
Published: September 1, 2010

Yuanzheng Gong and Song Zhang, "Ultrafast 3-D shape measurement with an off-the-shelf DLP projector," Opt. Express 18, 19743-19754 (2010)

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