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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 19 — Sep. 13, 2010
  • pp: 20491–20497

Characterization of birefringent material using polarization-controlled terahertz spectroscopy

Liangliang Zhang, Hua Zhong, Chao Deng, Cunlin Zhang, and Yuejin Zhao  »View Author Affiliations


Optics Express, Vol. 18, Issue 19, pp. 20491-20497 (2010)
http://dx.doi.org/10.1364/OE.18.020491


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Abstract

We present a polarization-controlled terahertz(THz) spectroscopy method to characterize the birefringent materials. The polarization of THz wave was controlled by changing the relative phase of the fundamental and second-harmonic waves in the two-color laser-induced air plasma THz generation configuration. The optical axis orientation was investigated through detecting one component of the transmitted THz electric field by continuously changing the electric field direction of the linearly polarized incident THz wave. This work demonstrates that the polarization-controlled THz spectroscopy can be used to study the anisotropy of the inner structure for birefringent materials.

© 2010 OSA

OCIS Codes
(260.1440) Physical optics : Birefringence
(260.5430) Physical optics : Polarization

ToC Category:
Spectroscopy

History
Original Manuscript: July 19, 2010
Revised Manuscript: August 31, 2010
Manuscript Accepted: August 31, 2010
Published: September 10, 2010

Citation
Liangliang Zhang, Hua Zhong, Chao Deng, Cunlin Zhang, and Yuejin Zhao, "Characterization of birefringent material using polarization-controlled terahertz spectroscopy," Opt. Express 18, 20491-20497 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-19-20491


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