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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 2 — Jan. 18, 2010
  • pp: 1316–1322

Calibration of electron spectrometer resolution 
in attosecond streak camera

Ximao Feng, Steve Gilbertson, Sabih D. Khan, Michael Chini, Yi Wu, Kevin Carnes, and Zenghu Chang  »View Author Affiliations


Optics Express, Vol. 18, Issue 2, pp. 1316-1322 (2010)
http://dx.doi.org/10.1364/OE.18.001316


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Abstract

We report a new method for determining the energy resolution of time-of-flight spectrometers for detecting photoelectrons produced with attosecond XUV pulses. By measuring the width of the 2s2p autoionization line of helium, we found the resolution of our spectrometer to be ~0.6 eV for electrons at 35.5 eV. Furthermore, the resolution in the 10 to 35 eV range was determined by applying a retarding potential at the entrance of the drift tube.

© 2010 OSA

OCIS Codes
(320.7090) Ultrafast optics : Ultrafast lasers
(020.2649) Atomic and molecular physics : Strong field laser physics

ToC Category:
Ultrafast Optics

History
Original Manuscript: November 24, 2009
Revised Manuscript: December 30, 2009
Manuscript Accepted: January 1, 2010
Published: January 12, 2010

Citation
Ximao Feng, Steve Gilbertson, Sabih D. Khan, Michael Chini, Yi Wu, Kevin Carnes, and Zenghu Chang, "Calibration of electron spectrometer resolution 
in attosecond streak camera," Opt. Express 18, 1316-1322 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-2-1316


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