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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 2 — Jan. 18, 2010
  • pp: 1469–1478

Optical loss reduction in high-index-contrast chalcogenide glass waveguides via thermal reflow

Juejun Hu, Ning-Ning Feng, Nathan Carlie, Laeticia Petit, Anu Agarwal, Kathleen Richardson, and Lionel Kimerling  »View Author Affiliations


Optics Express, Vol. 18, Issue 2, pp. 1469-1478 (2010)
http://dx.doi.org/10.1364/OE.18.001469


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Abstract

A thermal reflow technique is applied to high-index-contrast, sub-micron waveguides in As2S3 chalcogenide glass to reduce the sidewall roughness and associated optical scattering loss. We show that the reflow process effectively decreases sidewall roughness of chalcogenide glass waveguides. A kinetic model is presented to quantitatively explain the sidewall roughness evolution during thermal reflow. Further, we develop a technique to calculate waveguide optical loss using the roughness evolution model, and predict the ultimate low loss limit in reflowed high-index-contrast glass waveguides. Up to 50% optical loss reduction after reflow treatment is experimentally observed, and the practical loss limiting factors are discussed.

© 2010 OSA

OCIS Codes
(130.2790) Integrated optics : Guided waves
(130.3120) Integrated optics : Integrated optics devices
(130.3130) Integrated optics : Integrated optics materials
(160.2750) Materials : Glass and other amorphous materials
(230.7390) Optical devices : Waveguides, planar
(240.5770) Optics at surfaces : Roughness
(290.5880) Scattering : Scattering, rough surfaces

ToC Category:
Integrated Optics

History
Original Manuscript: October 20, 2009
Revised Manuscript: December 23, 2009
Manuscript Accepted: December 28, 2009
Published: January 12, 2010

Citation
Juejun Hu, Ning-Ning Feng, Nathan Carlie, Laeticia Petit, Anu Agarwal, Kathleen Richardson, and Lionel Kimerling, "Optical loss reduction in high-index-contrast chalcogenide glass waveguides via thermal reflow," Opt. Express 18, 1469-1478 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-2-1469


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