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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 2 — Jan. 18, 2010
  • pp: 426–438

Standing wave Spectrometer

Vladislav Jovanov, Jordan Ivanchev, and Dietmar Knipp  »View Author Affiliations

Optics Express, Vol. 18, Issue 2, pp. 426-438 (2010)

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A standing wave Fourier transform spectrometer is realized. The spectrometer consists of an ultra thin and partially transparent photodetector and a tunable mirror. The incident light forms a standing wave in front of the mirror, which is sampled by the ultra thin optical detector. The thickness of the photodetector is significantly smaller than the wavelength of the incident light. The spectral information of the incident light is determined by the Fourier transform of the detector signal. The linear arrangement of the optical detector and the mirror enables the realization of spectrometer arrays and optical cameras with high spectral resolution. For the first time a complete optical model of the standing wave spectrometer is presented and compared with experimental results. The influence of the design of the optical detector on the performance of the spectrometer is discussed.

© 2010 OSA

OCIS Codes
(230.5170) Optical devices : Photodiodes
(300.6190) Spectroscopy : Spectrometers
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

ToC Category:

Original Manuscript: September 9, 2009
Revised Manuscript: November 23, 2009
Manuscript Accepted: November 24, 2009
Published: January 4, 2010

Vladislav Jovanov, Jordan Ivanchev, and Dietmar Knipp, "Standing wave Spectrometer," Opt. Express 18, 426-438 (2010)

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  1. R. F. Wolffenbuttel, “State-of-the-Art in Integrated Optical Microspectrometers,” IEEE Tr, IM, Vol. 53(1), 197 (2004).
  2. P. M. Zavracky, K. L. Denis, H. K. Xie, T. Wester, and P. Kelley, “A micromachined scanning Fabry–Pérot interferometer,” Proc. SPIE (3514), 179–187 (1998).
  3. G. M. Yee, N. I. Maluf, P. A. Hing, M. Albin, and G. T. A. Kovacs, “Miniature spectrometers for biochemical analysis,” Sens. Act. A-Phys. 58(1), 61–66 (1997). [CrossRef]
  4. O. Manzardo, H. P. Herzig, C. R. Marxer, and N. F. de Rooij, “Miniaturized time-scanning Fourier transform spectrometer based on silicon technology,” Opt. Lett. 24(23), 1705–1707 (1999). [CrossRef]
  5. D. A. B. Miller, “Laser Tuners and Wavelength-sensitive Detectors based on absorbers in Standing Waves,” IEEE J. Quantum Electron. 30(3732), (1994). [CrossRef]
  6. M. Sasaki, X. Y. Mi, and K. Hane, “Standing wave detection and interferometer application using a photodiode thinner than optical wavelength,” Applied Physics Letters,Vol. 75(14), 2008–2010 (1999). [CrossRef]
  7. H. L. Kung, S. R. Bhalotra, J. D. Mansell, D. A. B. Miller, and J. S. Harris., “Standing-wave transform spectrometer based on integrated MEMS mirror and thin-film photodetector,” IEEE Sel. Top. Quantum Electron. 8(1), 98–105 (2002). [CrossRef]
  8. D. Knipp, H. Stiebig, S. R. Bhalotra, E. Bunte, H. L. Kung, and D. A. B. Miller, “Silicon based Micro-Fourier spectrometer,” IEEE Trans. Electron Dev. 52(3), 419–426 (2005). [CrossRef]
  9. E. le Coarer, S. Blaize, P. Benech, I. Stefanon, A. Morand, G. Lérondel, G. Leblond, P. Kern, J. M. Fedeli, and P. Royer, “Wavelength-scale stationary-wave integrated Fourier-transform spectrometry,” Nat. Photonics 1(8), 473–478 (2007). [CrossRef]
  10. W. Luft, and Y. Tuso, “Hydrogenated amorphous silicon alloy deposition processes”, Marcel Dekker, Inc., 1993.
  11. J. Kauppinen, and J. Partanen, “Fourier Transforms in Spectroscopy”, Wiley-VCH, 2001.
  12. Z. Knittl, “Optics of Thin Films”, New York: Wiley, 1976.
  13. P. G. Herzog, D. Knipp, H. Stiebig, and F. König, “Colorimetrical Characterization of novel multiple-channel sensors for imaging and metrology,” J. Electron. Imaging 8(4), 342–353 (1999). [CrossRef]
  14. O. Kluth, and A. Löffl, S. Wieder, C. Beneking, L. Houben, B. Rech, H. Wagner, S. Waser, J.A. Selvan, H. Keppner, “Texture etched Al-doped ZnO: A new material for enhanced light trapping in thin film solar cells”, Proc. 26th IEEE PVSEC, pp. 715–718 (1997).
  15. “Technology and Applications of Amorphous Silicon”, Springer Series in Material Science, 37. edited by R. A. Street, Berlin, Germany: Springer-Verlag, 2000.
  16. H. Stiebig, H.-J. Büchner, E. Bunte, V. Mandryka, D. Knipp, and G. Jäger, “Standing wave detection by thin transparent n–i–p diodes of amorphous silicon,” Thin Solid Films 427(1-2), 152–156 (2003). [CrossRef]
  17. H. Stiebig, D. Knipp, S. R. Bhalotra, H. L. Kung, and D. A. B. Miller, “Interferometric Sensors for Spectral Imaging”, Sens. Act. A: Phys. 120, 110–114 (2005). [CrossRef]

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