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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 20 — Sep. 27, 2010
  • pp: 20585–20594

Quantitative-phase-contrast imaging of a two-level surface described as a 2D linear filtering process

Luděk Lovicar, Jiří Komrska, and Radim Chmelík  »View Author Affiliations

Optics Express, Vol. 18, Issue 20, pp. 20585-20594 (2010)

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The paper deals with quantitative phase imaging of two-height-level surface reliefs. The imaging is considered to be a linear system and, consequently, the Fourier transform of the image is the product of the Fourier transform of a 2D function characterizing the surface and a specific 2D coherent transfer function. The Fourier transform of functions specifying periodic surface reliefs is factorized into two functions similar to lattice and structure amplitudes in crystal structure analysis. The approach to the imaging process described in the paper enables us to examine the dependence of the phase image on the surface geometry. Theoretical results are verified experimentally by means of a digital holographic microscope.

© 2010 OSA

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(180.3170) Microscopy : Interference microscopy

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: July 22, 2010
Revised Manuscript: September 4, 2010
Manuscript Accepted: September 5, 2010
Published: September 14, 2010

Luděk Lovicar, Jiří Komrska, and Radim Chmelík, "Quantitative-phase-contrast imaging of a two-level surface described as a 2D linear filtering process," Opt. Express 18, 20585-20594 (2010)

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